Modular probes

LP2 and LP2H

For workpiece inspection and job set-up on all sizes of lathes, machining centres and CNC grinders. LP2 features a stylus spring force which is adjustable for different applications. LP2H has a higher, fixed spring force, allowing the use of longer styli and providing greater resistance to machine vibration. Double diaphragm (DD) variants for both probes are available for enhanced sealing when used in harsh environments with particle-laden coolant.

• Proven kinematic design.
• Interference-resistant, hard-wired communication.
• Miniature design (25 mm in diameter)
• Robust probe design for operation in harsh machining environments.
  1.00 µm 2σ repeatability (LP2) / 2.00 µm 2σ repeatability (LP2H).
  All probe variants are suitable for use with the modular OMP40M and OMP60M optical transmission systems and RMP40M and RMP60M radio transmission systems. They can also be mounted directly to a machine and hard-wired for component inspection in grinding applications.